Capabilities
List of Available Tools
Tool Make and Model
Key Differentiator
Node
J. A. Woollam M-2000-DI (ANU)
Spectral Ellipsometer
ACT
ACT
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Description
Fully automated spectral ellipsometer to measure refractive index and thickness of materials.
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Related Information
Spectral Range of 193 to 1,700 nm.
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Tool Owner
J.A. Woollam IR-VASE (UoA)
Measuring complex refractive index or dielectric function of thin films.
Optofab
Optofab
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Description
Common measurements include coating thickness, IR refractive indices and molecular bond vibrations.
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Related Information
Specification: 1.7 to 30 μm (333 to 5900 wavenumbers)
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Tool Owner
J. A. Woollam VUV VASE (Gen-II) (UQ)
Variable angle spectroscopic ellipsometer
QLD
QLD
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Description
Versatile, easy to use ellipsometer for measurement of optical properties, film thickness and refractive index.
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Related Information
Sample substrates up to 50 mm.
Spectral range of 140 – 1700 nm.
Incident angle between 40 – 90° using XY stage.
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Tool Owner