Capabilities
List of Available Tools
Tool Make and Model
Key Differentiator
Node
NT-MDT Ntegra Solaris (UoA)
Scanning Near-Field Optical Microscope (SNOM) and Atomic Force Microscope (AFM)
Optofab
Optofab
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Description
The Atomic Force Microscope (AFM) is primarily used to measure and analyse surface topography and morphology, providing nanoscale height measurements.
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Related Information
An AFM used for relatively small and flat samples. The maximum scan area is 100 x 100 microns and it can scan features up to 10 microns in height. The SNOM/AFM can run in collection or transmission mode, and is equipped with an IR detector and an in-built red laser.
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Tool Owner