Scanning Near-field Optical Microscopy (SNOM)
Testing and validation > Microscopy
Scanning Near-field Optical Microscopy (SNOM) combines imaging and spectroscopy in the VIS, IR and THz spectral regions at 10 nm spatial resolution.
It is used during plasmonic analysis, nanoscale stress and strain testing, and observations of free charge carrier distribution.
List of Available Tools
Tool Make and Model
NT-MDT Ntegra Solaris (UoA)
Scanning Near-Field Optical Microscope (SNOM) and Atomic Force Microscope (AFM)
The Atomic Force Microscope (AFM) is primarily used to measure and analyse surface topography and morphology, providing nanoscale height measurements.
An AFM used for relatively small and flat samples. The maximum scan area is 100 x 100 microns and it can scan features up to 10 microns in height. The SNOM/AFM can run in collection or transmission mode, and is equipped with an IR detector and an in-built red laser.