Reflectometry

Testing and validation > Thin Film Characterisation

Description

Reflectometry is the characterisation of a surface or interface using the information gathered by the reflected wave of a generated signal. The signal can be light, sound, or particles.

Contact Us

List of Available Tools

Tool Make and Model

Key Differentiator

Node

SCI FilmTek 2000M (UQ)

Benchtop spectroscopic reflectometer

QLD

QLD

  • Description
  • Related Information
  • Tool Owner
  • Description

    Provides quick and simple measurements of film thickness, index of refraction and extinction coefficient using reflected and absorbed white light when analysing transparent or semi-transparent thin films.

  • Related Information

    Spot size of 2 – 50 µm.

    Sample size up to 6 inch wafer.

    Film thickness range of 3 nm to 350 µm.

    Spectral range of 240 to 950 nm. 

  • Tool Owner

Get Enlightened by ANFF

ANFF now offers nanofabrication training online. Click the button below to visit our learning resource, ANFF Enlightened, and gain the fab knowledge required to take your R&D further.

Visit ANFF Enlightened