Capabilities
List of Available Tools
Tool Make and Model
Key Differentiator
Node
Jobin Yvon HR800 (UoW)
Raman spectrometer
Materials Node
Materials Node
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Description
Capable of high speed Raman mapping
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Related Information
405, 534, 633 & 785 nm laser lines, 100cm-1 cut-offs on all lines. 10cm-1 cut-offs on 534 & 633nm lines.
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Tool Owner
Bruker Avance III NMR (UoW)
Nuclear magnetic resonance (NMR) spectroscopy
Materials Node
Materials Node
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Description
High performance nuclear magnetic resonance system
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Related Information
Provides 400 MHz NMR. Autosampling is available.
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Tool Owner
KLA Surfscan 7700 (Griffith)
Wafer inspection system
QLD
QLD
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Description
Fast, fully automatic, jig to jig, non-contact surface measurement. Particle Sensitivity 150nm. Processes Si wafers of 150mm – 675µm
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Related Information
Used to determine defects on bare Si, coated Si and patterned wafers.
Calibrated by diameter latex spheres on bare silicon.
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Tool Owner
Thermo Fisher Scientific Nicolet Almega XR (UQ)
Dispersive Raman Microscope
QLD
QLD
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Description
Profiles large areas of samples of polymers, coal, and other organic materials.
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Related Information
Fourier Transform Raman spectrometer (1064 nm Laser).
Collects Raman spectra between 400 – 4000cm-1
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Tool Owner
Flinders Custom Specs (Flinders)
Metastable induced electron spectrometer (MIES) and Nanocluster deposition chamber
SA
SA
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Description
Electron and ion spectrometer used to characterise the electronic structure of surfaces. The instrument also houses a deposition source to make nanoclusters/nanocatalysts.
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Related Information
Electron spectroscopies available include X-Ray photoelectron spectroscopy (XPS), ultra-violet photoelectron spectroscopy (UPS), inverse photoelectron spectroscopy(IPES) and metastable induced electron spectroscopy (MIES). Ion scattering spectroscopy (ISS) and ion sputtering is available. The deposition attachment allows size selected sputter deposition for the purpose of nanocluster growth.
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Tool Owner
Flinders Custom Specs (Flinders)
Metastable induced electron spectrometer (MIES) and Nanocluster deposition chamber
SA
SA
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Description
Electron and ion spectrometer used to characterise the electronic structure of surfaces. The instrument also houses a deposition source to make nanoclusters/nanocatalysts.
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Related Information
Electron spectroscopies available include X-Ray photoelectron spectroscopy (XPS), ultra-violet photoelectron spectroscopy (UPS), inverse photoelectron spectroscopy(IPES) and metastable induced electron spectroscopy (MIES). Ion scattering spectroscopy (ISS) and ion sputtering is available. The deposition attachment allows size selected sputter deposition for the purpose of nanocluster growth.
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Tool Owner
Custom IR characterisation system (UWA)
Cryostat IR array characterisation system
WA
WA
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Description
IR transmission/reflection system to characterise spectrometer/filter performance
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Related Information
Offers SWIR, MWIR and LWIR characterisation
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Tool Owner
Custom DLTS (UWA)
Deep-level transient spectroscopy (DLTS)
WA
WA
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Description
Characterisation of semiconductor bandgap energy levels using deep-level transient spectroscopy (DLTS)
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Related Information
Custom built equipment.
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Tool Owner
