Other spectroscopy

Testing and validation > Spectroscopy

Description

Variations on the theme of spectroscopy provide specific advantages for a range of uses – tweaking of the principle of observing the spectral output of materials in a variety of conditions can provide incredible amounts of information about the composition of a sample.

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List of Available Tools

Tool Make and Model

Key Differentiator

Node

Jobin Yvon HR800 (UoW)

Raman spectrometer

Materials Node

Materials Node

  • Description
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  • Tool Owner
  • Description

    Capable of high speed Raman mapping

  • Related Information

    405, 534, 633 & 785 nm laser lines, 100cm-1 cut-offs on all lines. 10cm-1 cut-offs on 534 & 633nm lines.

  • Tool Owner

Bruker Avance III NMR (UoW)

Nuclear magnetic resonance (NMR) spectroscopy

Materials Node

Materials Node

  • Description
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  • Tool Owner
  • Description

    High performance nuclear magnetic resonance system

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    Provides 400 MHz NMR. Autosampling is available.

  • Tool Owner

KLA Surfscan 7700 (Griffith)

Wafer inspection system

QLD

QLD

  • Description
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  • Tool Owner
  • Description

    Fast, fully automatic, jig to jig, non-contact surface measurement. Particle Sensitivity 150nm. Processes Si wafers of 150mm – 675µm

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    Used to determine defects on bare Si, coated Si and patterned wafers.

    Calibrated by diameter latex spheres on bare silicon.

  • Tool Owner

Thermo Fisher Scientific Nicolet Almega XR (UQ)

Dispersive Raman Microscope

QLD

QLD

  • Description
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  • Tool Owner
  • Description

    Profiles large areas of samples of polymers, coal, and other organic materials.

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    Fourier Transform Raman spectrometer (1064 nm Laser).

    Collects Raman spectra between 400 – 4000cm-1

  • Tool Owner

Flinders Custom Specs (Flinders)

Metastable induced electron spectrometer (MIES) and Nanocluster deposition chamber

SA

SA

  • Description
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  • Tool Owner
  • Description

    Electron and ion spectrometer used to characterise the electronic structure of surfaces. The instrument also houses a deposition source to make nanoclusters/nanocatalysts.

  • Related Information

    Electron spectroscopies available include X-Ray photoelectron spectroscopy (XPS), ultra-violet photoelectron spectroscopy (UPS), inverse photoelectron spectroscopy(IPES) and metastable induced electron spectroscopy (MIES). Ion scattering spectroscopy (ISS) and ion sputtering is available. The deposition attachment allows size selected sputter deposition for the purpose of nanocluster growth.

  • Tool Owner

Flinders Custom Specs (Flinders)

Metastable induced electron spectrometer (MIES) and Nanocluster deposition chamber

SA

SA

  • Description
  • Related Information
  • Tool Owner
  • Description

    Electron and ion spectrometer used to characterise the electronic structure of surfaces. The instrument also houses a deposition source to make nanoclusters/nanocatalysts.

  • Related Information

    Electron spectroscopies available include X-Ray photoelectron spectroscopy (XPS), ultra-violet photoelectron spectroscopy (UPS), inverse photoelectron spectroscopy(IPES) and metastable induced electron spectroscopy (MIES). Ion scattering spectroscopy (ISS) and ion sputtering is available. The deposition attachment allows size selected sputter deposition for the purpose of nanocluster growth.

  • Tool Owner

Custom IR characterisation system (UWA)

Cryostat IR array characterisation system

WA

WA

  • Description
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  • Tool Owner
  • Description

    IR transmission/reflection system to characterise spectrometer/filter performance

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    Offers SWIR, MWIR and LWIR characterisation

  • Tool Owner

Custom DLTS (UWA)

Deep-level transient spectroscopy (DLTS)

WA

WA

  • Description
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  • Tool Owner
  • Description

    Characterisation of semiconductor bandgap energy levels using deep-level transient spectroscopy (DLTS)

  • Related Information

    Custom built equipment.

  • Tool Owner

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