Capabilities
List of Available Tools
Tool Make and Model
Key Differentiator
Node
Custom EQE (UoN)
External quantum efficiency (EQE) measurement system
Materials Node
Materials Node
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Description
A measurement system to determine the ability of a solar cell to convert incident photons into electrons at varying wavelengths. Designed to integrate with lab scale devices, this custom system scans from 300 to 1,100 nm and has capacity to extend further in the spectrum.
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Related Information
Standard sample size is 12.5 x 17.5 cm.
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Tool Owner
Newport Oriel (UoN)
Solar simulator
Materials Node
Materials Node
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Description
Tool for comparing the performance of solar cells under standardised conditions
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Related Information
AM1.5 AAA rated, 1000W.
25 mm2 centre region.
50 mm collimated beam.
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Tool Owner
Karl Suss PM5 Probe Station (USYD)
Probe station
NSW
NSW
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Description
4 probe DC probe station for measuring electrical properties of materials and devices.
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Related Information
Substrate size up to 6 inch wafer. Can heat substrate up to 120 degrees centigrade during measurement.
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Tool Owner
Custom Probe Station (UNSW)
Four point probe
NSW
NSW
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Description
More information to come
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Related Information
More information to come
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Tool Owner
NKT Photonics SuperK Super Continuum (MQ)
Photonics Characterisation Suite - Source
Optofab
Optofab
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Description
Super continuum source for optical characterisation.
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Related Information
Operates in the visible and near IR regimes.
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Tool Owner
PV Measurements QEX7 (UQ)
Quantum efficiency and spectral response measurement system for solar cell measurement
QLD
QLD
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Description
This Quantum Efficiency(QE)/Spectral Response(SR)/Incident Photon to Current Conversion Efficiency(IPCE)/IV Measurement System is a low-cost, high-performance quantum efficiency measurement system for solar cell analysis. Supplies a calibrated light intensity over known spectrum for testing solar cell efficiency and performance.
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Related Information
Scan range 300 – 1100 nm.
High resolution scan in <1 min. Probe beam between 1-20 mm. AC and DC measurement modes. Chopping Frequency 1 - 120Hz. Integrated IV measurement.
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Tool Owner
Semiprobe SA-6 (UQ)
Probe station
QLD
QLD
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Description
Used to probe optoelectronic and semiconductor materials. Integrated into a glovebox system.
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Related Information
4 probe DC probe station for measuring electrical properties of materials and devices.
Substrate size up to 6 inch wafer.
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Tool Owner
Agilent Technologies Agilent B1500A Analyzer in Physics (UQ)
Semiconductor Device Analyser
QLD
QLD
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Description
Testing of organic and electronic circuits. Provides IV, CV and pulsed measurements of conductive, capacitive, inductive or semiconductor samples
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Related Information
Measurements functions: Sweep/spot, multichannel sweep, list sweep, time sampling, quasi-static CV, high frequency CV (to 5 MHz) and a direct control mode.
Easyexpert is also supplied with an extensive library of over 230 application tests.
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Tool Owner
Keithlink Four Point Probe (UQ)
Probe station
QLD
QLD
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Description
Provides sheet resistance measurements of metal oxide thin films.
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Related Information
Uses high input impedance meter to measure voltage drop when current applied by other two probes.
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Tool Owner
Agilent Technologies 4156A Semiconductor Parameter Analyzer (UWA)
Semiconductor parameter analyser
WA
WA
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Description
Digital sweep parameter. Used for failure analysis and automated incoming inspection.
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Related Information
Features four built in source measurement units (SMUs), two voltage monitor units (VMUs) and two Voltage Source Unit (VSU).
Current resolution to 1fA and the accuracy of to 20fA.
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Tool Owner
Custom Electrical Characterisation (UWA)
Hall effect measurement system
WA
WA
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Description
2T electromagnet to perform Hall effect measurements
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Related Information
Magnetic fields ranging from -2 Tesla to +2 Telsa. Controlling the sample temperature between 90K and 350K using liquid nitrogen.
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Tool Owner
Rucker & Kolls 680A (UWA)
Semi-automatic wafer probe station
WA
WA
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Description
Probe station with B&L Microzoom
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Related Information
6 inch chuck with 6 x 6 inch travel.
Programmable automatic stepping.
Manual mode motorised movement.
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Tool Owner
Waterloo Scientific LBIC by Waterloo Scientific (UWA)
Laser Beam Induced Current (LBIC) Scanning Laser Microscope
WA
WA
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Description
Mapping of material quality and device performance using a laser induced current.
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Related Information
Features an integrated cryogenic capability.
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Tool Owner
