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Electrical characterisation
Electrical characterisation
For electrical devices, MEMS, and solar cells, the electrical properties are often what dictates whether the device is performing as expected. As such there are a range of ways to understand different aspects of these properties.
List of available equipment
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Agilent Technologies 4156A Semiconductor Parameter Analyzer
Semiconductor parameter analyser
University of Western Australia
WA Node
Description
Digital sweep parameter. Used for failure analysis and automated incoming inspection.
Related Information
Features four built in source measurement units (SMUs), two voltage monitor units (VMUs) and two Voltage Source Unit (VSU). Current resolution to 1fA and the accuracy of to 20fA.
Tool Contact
anff-wa@uwa.edu.au
Agilent Technologies Agilent B1500A Analyzer
Semiconductor Device Analyser
QLD Node
University of Queensland
Description
Testing of organic and electronic circuits. Provides IV, CV and pulsed measurements of conductive, capacitive, inductive or semiconductor samples
Related Information
Measurements functions: Sweep/spot, multichannel sweep, list sweep, time sampling, quasi-static CV, high frequency CV (to 5 MHz) and a direct control mode. Easyexpert is also supplied with an extensive library of over 230 application tests.
Tool Contact
anff@uq.edu.au
Custom Electrical Characterisation
Hall effect measurement system
University of Western Australia
WA Node
Description
2T electromagnet to perform Hall effect measurements
Related Information
Magnetic fields ranging from -2 Tesla to +2 Telsa. Controlling the sample temperature between 90K and 350K using liquid nitrogen.
Tool Contact
anff-wa@uwa.edu.au
Custom EQE
External quantum efficiency (EQE) measurement system
Materials Node
University of Newcastle
Description
A measurement system to determine the ability of a solar cell to convert incident photons into electrons at varying wavelengths. Designed to integrate with lab scale devices, this custom system scans from 300 to 1,100 nm and has capacity to extend further in the spectrum.
Related Information
Standard sample size is 12.5 x 17.5 cm.
Tool Contact
anff@newcastle.edu.au
Custom Probe Station
Four point probe
NSW Node
University of New South Wales
Description
four point probe
Related Information
More information to come.
Tool Contact
anff@unsw.edu.au
Karl Suss PM5 Probe Station
Probe station
NSW Node
University of Sydney
Description
4 probe DC probe station for measuring electrical properties of materials and devices.
Related Information
Substrate size up to 6 inch wafer. Can heat substrate up to 120 degrees centigrade during measurement.
Tool Contact
rpf.queries@sydney.edu.au
Keithlink Four Point Probe
Probe station
QLD Node
University of Queensland
Description
Provides sheet resistance measurements of metal oxide thin films.
Related Information
Uses high input impedance meter to measure voltage drop when current applied by other two probes.
Tool Contact
anff@uq.edu.au
Newport Oriel
Solar simulator
Materials Node
University of Newcastle
Description
Tool for comparing the performance of solar cells under standardised conditions
Related Information
AM1.5 AAA rated, 1000W. 25 mm2 centre region. 50 mm collimated beam.
Tool Contact
anff@newcastle.edu.au
NKT Photonics SuperK Super Continuum
Photonics Characterisation Suite - Source
Macquarie University
Optofab Node
Description
Super continuum source for optical characterisation.
Related Information
Operates in the visible and near IR regimes.
Tool Contact
benjamin.johnston@mq.edu.au
PV Measurements QEX7
Quantum efficiency and spectral response measurement system for solar cell measurement
QLD Node
University of Queensland
Description
This Quantum Efficiency(QE)/Spectral Response(SR)/Incident Photon to Current Conversion Efficiency(IPCE)/IV Measurement System is a low-cost, high-performance quantum efficiency measurement system for solar cell analysis. Supplies a calibrated light intensity over known spectrum for testing solar cell efficiency and performance.
Related Information
Scan range 300 - 1100 nm. High resolution scan in <1 min. Probe beam between 1-20 mm. AC and DC measurement modes. Chopping Frequency 1 - 120Hz. Integrated IV measurement.
Tool Contact
anff@uq.edu.au
Rucker & Kolls 680A
Semi-automatic wafer probe station
University of Western Australia
WA Node
Description
Probe station with B&L Microzoom
Related Information
6 inch chuck with 6 x 6 inch travel. Programmable automatic stepping. Manual mode motorised movement.
Tool Contact
anff-wa@uwa.edu.au
Semiprobe SA-6
Probe station
QLD Node
University of Queensland
Description
Used to probe optoelectronic and semiconductor materials. Integrated into a glovebox system.
Related Information
4 probe DC probe station for measuring electrical properties of materials and devices. Substrate size up to 6 inch wafer.
Tool Contact
anff@uq.edu.au
Waterloo Scientific LBIC by Waterloo Scientific
Laser Beam Induced Current (LBIC) Scanning Laser Microscope
University of Western Australia
WA Node
Description
Mapping of material quality and device performance using a laser induced current.
Related Information
Features an integrated cryogenic capability.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Agilent Technologies 4156A Semiconductor Parameter Analyzer
Semiconductor parameter analyser
University of Western Australia
WA Node
Description
Digital sweep parameter. Used for failure analysis and automated incoming inspection.
Related Information
Features four built in source measurement units (SMUs), two voltage monitor units (VMUs) and two Voltage Source Unit (VSU). Current resolution to 1fA and the accuracy of to 20fA.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Agilent Technologies Agilent B1500A Analyzer
Semiconductor Device Analyser
University of Western Australia
WA Node
Description
Testing of organic and electronic circuits. Provides IV, CV and pulsed measurements of conductive, capacitive, inductive or semiconductor samples
Related Information
Measurements functions: Sweep/spot, multichannel sweep, list sweep, time sampling, quasi-static CV, high frequency CV (to 5 MHz) and a direct control mode. Easyexpert is also supplied with an extensive library of over 230 application tests.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Custom Electrical Characterisation
Hall effect measurement system
University of Western Australia
WA Node
Description
2T electromagnet to perform Hall effect measurements
Related Information
Magnetic fields ranging from -2 Tesla to +2 Telsa. Controlling the sample temperature between 90K and 350K using liquid nitrogen.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Custom EQE
External quantum efficiency (EQE) measurement system
University of Western Australia
WA Node
Description
A measurement system to determine the ability of a solar cell to convert incident photons into electrons at varying wavelengths. Designed to integrate with lab scale devices, this custom system scans from 300 to 1,100 nm and has capacity to extend further in the spectrum.
Related Information
Standard sample size is 12.5 x 17.5 cm.
Tool Contact
anff@newcastle.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Custom Probe Station
Four point probe
University of Western Australia
WA Node
Description
four point probe
Related Information
More information to come.
Tool Contact
anff@unsw.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Karl Suss PM5 Probe Station
Probe station
University of Western Australia
WA Node
Description
4 probe DC probe station for measuring electrical properties of materials and devices.
Related Information
Substrate size up to 6 inch wafer. Can heat substrate up to 120 degrees centigrade during measurement.
Tool Contact
rpf.queries@sydney.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Keithlink Four Point Probe
Probe station
University of Western Australia
WA Node
Description
Provides sheet resistance measurements of metal oxide thin films.
Related Information
Uses high input impedance meter to measure voltage drop when current applied by other two probes.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Newport Oriel
Solar simulator
University of Western Australia
WA Node
Description
Tool for comparing the performance of solar cells under standardised conditions
Related Information
AM1.5 AAA rated, 1000W. 25 mm2 centre region. 50 mm collimated beam.
Tool Contact
anff@newcastle.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
NKT Photonics SuperK Super Continuum
Photonics Characterisation Suite - Source
University of Western Australia
WA Node
Description
Super continuum source for optical characterisation.
Related Information
Operates in the visible and near IR regimes.
Tool Contact
benjamin.johnston@mq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
PV Measurements QEX7
Quantum efficiency and spectral response measurement system for solar cell measurement
University of Western Australia
WA Node
Description
This Quantum Efficiency(QE)/Spectral Response(SR)/Incident Photon to Current Conversion Efficiency(IPCE)/IV Measurement System is a low-cost, high-performance quantum efficiency measurement system for solar cell analysis. Supplies a calibrated light intensity over known spectrum for testing solar cell efficiency and performance.
Related Information
Scan range 300 - 1100 nm. High resolution scan in <1 min. Probe beam between 1-20 mm. AC and DC measurement modes. Chopping Frequency 1 - 120Hz. Integrated IV measurement.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Rucker & Kolls 680A
Semi-automatic wafer probe station
University of Western Australia
WA Node
Description
Probe station with B&L Microzoom
Related Information
6 inch chuck with 6 x 6 inch travel. Programmable automatic stepping. Manual mode motorised movement.
Tool Contact
anff-wa@uwa.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Semiprobe SA-6
Probe station
University of Western Australia
WA Node
Description
Used to probe optoelectronic and semiconductor materials. Integrated into a glovebox system.
Related Information
4 probe DC probe station for measuring electrical properties of materials and devices. Substrate size up to 6 inch wafer.
Tool Contact
anff@uq.edu.au
TOOL MAKE AND MODEL
KEY DIFFERENTIATOR
LOCATION
Waterloo Scientific LBIC by Waterloo Scientific
Laser Beam Induced Current (LBIC) Scanning Laser Microscope
University of Western Australia
WA Node
Description
Mapping of material quality and device performance using a laser induced current.
Related Information
Features an integrated cryogenic capability.
Tool Contact
anff-wa@uwa.edu.au