Electrical characterisation

Testing and validation > Device validation

Description

For electrical devices, MEMS, and solar cells, the electrical properties are often what dictates whether the device is performing as expected. As such there are a range of ways to understand different aspects of these properties.

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List of Available Tools

Tool Make and Model

Key Differentiator

Node

Custom EQE (UoN)

External quantum efficiency (EQE) measurement system

Materials Node

Materials Node

  • Description
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  • Tool Owner
  • Description

    A measurement system to determine the ability of a solar cell to convert incident photons into electrons at varying wavelengths. Designed to integrate with lab scale devices, this custom system scans from 300 to 1,100 nm and has capacity to extend further in the spectrum.

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    Standard sample size is 12.5 x 17.5 cm.

  • Tool Owner

Newport Oriel (UoN)

Solar simulator

Materials Node

Materials Node

  • Description
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  • Tool Owner
  • Description

    Tool for comparing the performance of solar cells under standardised conditions

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    AM1.5 AAA rated, 1000W.

    25 mm2 centre region.

    50 mm collimated beam.

  • Tool Owner

Karl Suss PM5 Probe Station (USYD)

Probe station

NSW

NSW

  • Description
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  • Tool Owner
  • Description

    4 probe DC probe station for measuring electrical properties of materials and devices.

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    Substrate size up to 6 inch wafer. Can heat substrate up to 120 degrees centigrade during measurement.

  • Tool Owner

Custom Probe Station (UNSW)

Four point probe

NSW

NSW

  • Description
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  • Tool Owner
  • Description

    More information to come

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    More information to come

  • Tool Owner

NKT Photonics SuperK Super Continuum (MQ)

Photonics Characterisation Suite - Source

Optofab

Optofab

  • Description
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  • Tool Owner
  • Description

    Super continuum source for optical characterisation.

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    Operates in the visible and near IR regimes.

  • Tool Owner

PV Measurements QEX7 (UQ)

Quantum efficiency and spectral response measurement system for solar cell measurement

QLD

QLD

  • Description
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  • Tool Owner
  • Description

    This Quantum Efficiency(QE)/Spectral Response(SR)/Incident Photon to Current Conversion Efficiency(IPCE)/IV Measurement System is a low-cost, high-performance quantum efficiency measurement system for solar cell analysis. Supplies a calibrated light intensity over known spectrum for testing solar cell efficiency and performance.

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    Scan range 300 – 1100 nm.

    High resolution scan in <1 min. Probe beam between 1-20 mm. AC and DC measurement modes. Chopping Frequency 1 - 120Hz. Integrated IV measurement.

  • Tool Owner

Semiprobe SA-6 (UQ)

Probe station

QLD

QLD

  • Description
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  • Tool Owner
  • Description

    Used to probe optoelectronic and semiconductor materials. Integrated into a glovebox system.

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    4 probe DC probe station for measuring electrical properties of materials and devices.

    Substrate size up to 6 inch wafer.

  • Tool Owner

Agilent Technologies Agilent B1500A Analyzer in Physics (UQ)

Semiconductor Device Analyser

QLD

QLD

  • Description
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  • Tool Owner
  • Description

    Testing of organic and electronic circuits. Provides IV, CV and pulsed measurements of conductive, capacitive, inductive or semiconductor samples

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    Measurements functions: Sweep/spot, multichannel sweep, list sweep, time sampling, quasi-static CV, high frequency CV (to 5 MHz) and a direct control mode.

    Easyexpert is also supplied with an extensive library of over 230 application tests.

  • Tool Owner

Keithlink Four Point Probe (UQ)

Probe station

QLD

QLD

  • Description
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  • Tool Owner
  • Description

    Provides sheet resistance measurements of metal oxide thin films.

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    Uses high input impedance meter to measure voltage drop when current applied by other two probes.

  • Tool Owner

Agilent Technologies 4156A Semiconductor Parameter Analyzer (UWA)

Semiconductor parameter analyser

WA

WA

  • Description
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  • Tool Owner
  • Description

    Digital sweep parameter. Used for failure analysis and automated incoming inspection.

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    Features four built in source measurement units (SMUs), two voltage monitor units (VMUs) and two Voltage Source Unit (VSU).

    Current resolution to 1fA and the accuracy of to 20fA.

  • Tool Owner

Custom Electrical Characterisation (UWA)

Hall effect measurement system

WA

WA

  • Description
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  • Tool Owner
  • Description

    2T electromagnet to perform Hall effect measurements

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    Magnetic fields ranging from -2 Tesla to +2 Telsa. Controlling the sample temperature between 90K and 350K using liquid nitrogen.

  • Tool Owner

Rucker & Kolls 680A (UWA)

Semi-automatic wafer probe station

WA

WA

  • Description
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  • Tool Owner
  • Description

    Probe station with B&L Microzoom

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    6 inch chuck with 6 x 6 inch travel.

    Programmable automatic stepping.

    Manual mode motorised movement.

  • Tool Owner

Waterloo Scientific LBIC by Waterloo Scientific (UWA)

Laser Beam Induced Current (LBIC) Scanning Laser Microscope

WA

WA

  • Description
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  • Tool Owner
  • Description

    Mapping of material quality and device performance using a laser induced current.

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    Features an integrated cryogenic capability.

  • Tool Owner

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