Atomic Force Microscopy (AFM)

Testing and validation > Topological Analysis and Surface Profiling

Description

Atomic force microscopy (AFM) is one of the most versatile characterisation methods.

AFM performs scanning probe microscopy, scanning the surface of a material with a nanoscale cantilever, either through direct contact or through oscillating the cantilever just above the surface. When the cantilever is...

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List of Available Tools

Tool Make and Model

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Asylum Research Cypher ES (UoN)

Atomic force microscope (AFM) for polymer film analysis

Materials Node

Materials Node

  • Description
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  • Description

    An atomic force microscope which performs very high resolution probing of surfaces. The ES model of the Cypher has an environmental chamber, allowing for the control of temperature and the atmosphere around the sample. Dry and liquid AFM is possible with this system.

  • Related Information

    Typical sample size is maximum 10 mm x 10 mm.

    Scanning window is maximum 30 μm.

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Digital Instruments DI3000 (UNSW)

Atomic force microscope (AFM)

NSW

NSW

  • Description
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  • Description

    More information to come

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    More information to come

  • Tool Owner

NTEGRA NT-MDT (Griffith)

AFM/Raman with NeXT filter

QLD

QLD

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  • Description

    This tool provides chemical plus spatial mapping of a sample, and can perform AFM on the same area.

    It is used to capture spectroscopic analysis of materials, mapping, imaging and to observe in situ reactions under electrochemical control synthesis.

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    Sample size of 150 x 150 mm.

    Controlled temperature and gas environments.

    Remote operation for hazardous systems.

    Laser wavelengths available for Raman 325, 442, 514, 633 and 785nm.

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JPK NanoWizard II (UQ)

Atomic force microscope (AFM) for biological samples

QLD

QLD

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  • Description

    AFM with cell adhesion module, suitable for live cell imaging built on a Zeiss inverted microscope base.

    Modes available: fluid cell; temperature and gas control for biological samples; cohesion module (piezo crystal 100 µm in Z); optical/AFM image overlay; and electrochemical unit.

  • Related Information

    Large substrate size can be handled.

    Topological map of 90 µm x 90 µm with sub-nanometre resolution in Z.

  • Tool Owner

Asylum Research MFP3D-BIO (UQ)

Atomic force microscope (AFM) with inverted optical microscope

QLD

QLD

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    General use Atomic Force Microscope (AFM) built on a Nikon inverted microscope base for integrated scanning-probe and optical microscopy.

    Modes available; Kelvin force probe/adhesion and stiffness maps, conductivity maps and single molecule spectroscopy, viscoelastic mapping, magnetic force mapping.

  • Related Information

    Large substrate size can be handled.

    Topological map of 90 µm x 90 µm with sub-nanometre resolution in Z.

  • Tool Owner

WITec alpha300 RA+S (UQ)

Atomic force microscope (AFM) with Raman and SNOM functionality

QLD

QLD

  • Description
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  • Description

    Single system with the ability to analyse a the Raman spectrum, the surface topology and the SNOM signal of a sample.

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    Image size of 90 µm x 90 µm topological map and Raman map.

    Sub nm resolution in Z axis.

    532 and 633 nm laser sources for Raman.

    300nm Raman spot size.

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Asylum Research Cypher (UQ)

Atomic force microscope (AFM) with high resolution m

QLD

QLD

  • Description
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  • Description

    A purpose built AFM in a dedicated enclosure to investigate surface nanomechanics and topography.

    Modes available: Kelvin probe force microscopy (KPFM); high voltage piezoresponse force microscopy (HV-PFM); scanning tunnelling microscopy (STM); and AM-FM viscoelastic mapping mode.

  • Related Information

    Substrate size of 15mm diameter.

    Topological map of 30 µm x 30 µm.

  • Tool Owner

Horiba / Nanonics XploRA / MultiView 4000 (Flinders)

Raman confocal microscope and atomic force microscope (AFM) with tip-enhanced Raman spectroscopy (TERS) capability

SA

SA

  • Description
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  • Description

    Raman spectroscopy system, including a confocal microscope and an atomic force microscope which can perform tip enhanced Raman spectroscopy (TERS)

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    Confocal Raman system with large area scanning stage. Lasers available are 532, 638 and 786nm. TERS option allows spectra to be recorded with a spatial resolution of 90nm.

  • Tool Owner

Asylum Research MFP3D-BIO (La Trobe)

Atomic force microscope (AFM) with inverted optical microscope

VIC

VIC

  • Description
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  • Tool Owner
  • Description

    General use Atomic Force Microscope (AFM) built on a Nikon inverted microscope base for integrated scanning-probe and optical microscopy.

    Modes available; Kelvin force probe/adhesion and stiffness maps, conductivity maps and single molecule spectroscopy, viscoelastic mapping, magnetic force mapping.

  • Related Information

    Large substrate size can be handled.

    Topological map of 90 µm x 90 µm with sub-nanometre resolution in Z.

    Accessories: closed fluid cell, electrochemistry fluid cell, temperature-controlled fluid exchange, polymer heater.

  • Tool Owner

Asylum Research MFP3D-SA (La Trobe)

Atomic force microscope (AFM)

VIC

VIC

  • Description
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  • Description

    A versatile AFM mounted on an active-damping vibration-isolation table in an acoustic-isolation enclosure to improve resolution.

    Operating Modes: contact and non-contact (AC) AFM, EFM, MFM, lateral force microscopy (LFM), conductive AFM, KPFM, and nanolithography.

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    90 μm X-Y raster scanning

    Accessory features: closed fluid cell, electrochemistry fluid cell, temperature-controlled fluid exchange (BioHeater™), and polymer heater.

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Bruker Dimension Icon (MCN)

Atomic force microscope (AFM) with various condition control and usability modules

VIC

VIC

  • Description
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  • Description

    The Dimension Icon AFM features a number of application modules such as ScanAsyst, Peak Force QNMTM (PFQNM), electrical materials characterisation and heating and cooling studies.

    The ScanAsyst imaging mode performs automatic image optimisation by controlling the tip-sample interaction force for faster and more consistent imaging results.

    The PFQNM mode analyses tip-sample interaction forces and generates quantitative nanoscale maps of mechanical properties, including modulus, adhesion, deformation, and dissipation. PFQNM operates over an extremely wide range to characterise a large variety of sample types.

    The AFM executes temperature control and thermal analysis on samples from -35°C to 250°C while scanning in various AFM modes.

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    Features a large sample platform.

  • Tool Owner

JPK NanoWizard II (MCN)

Atomic force microscope (AFM) for biological samples

VIC

VIC

  • Description
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  • Tool Owner
  • Description

    AFM with cell adhesion module, suitable for live cell imaging built on a Zeiss inverted microscope base.

  • Related Information

    Large substrate size can be handled.

    Topological map of 90 µm x 90 µm with sub-nanometre resolution in Z.

  • Tool Owner

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