Capability directory

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I-V/ C-V/ DLTS/ Hall Effect Measurement Systems

I-V/ C-V/ DLTS/ Hall Effect Measurement Systems

Fabrication step: Device fabrication, packaging and testing
Function: Packaging and testing
Location: University of Western Australia
Purpose: measurement/characterisation
Material systems: Si-N-O/ H-Cd-Te/ Al-Ga-N-O/ BIG
Node: Western Australia
Scale/volume: up to 1 inch wafers