Capability directory

Types of fabrication



Or use capability keyword(s)

Organic device and electronics circuit testing

The test and characterization system consists of two parts: the semiautomatic probe station and the device analyser.

The semiautomatic probe station is SA-6 from semiprobe and it is a fast and reliable tabletop semiautomatic probing system for wafers of 150 mm and smaller. The SA-6 is easy to setup and operate.

It features:
• Compact, reliable and rigid design.
• Fast, accurate and repeatable performance.
• Industrial PC control base and user-friendly software.

The device analyser is Agilent B1500A with easyexpert software that supports all aspects of parametric testing, from basic manual measurements to testing automation across a wafer in conjunction with a semiautomatic wafer prober. The easyexpert software provides a wide array of measurement functions: sweep/spot, multichannel sweep, list sweep, time sampling, quasi-static CV, high frequency CV (to 5 MHz), and a direct control mode. Easyexpert is also supplied with an extensive library of over 230 application tests.

This test and characterization system is used to test:

  • Integrated circuits
  • Discrete devices
  • Resistor trimming
  • Substrates
  • Printed circuit boards
  • Flat panel displays
  • Multichip modules
  • High frequency/microwave devices
  • Optoelectronics
  • Device characterization
  • Failure analysis
Fabrication step: Device fabrication, packaging and testing
Function: Packaging and testing
Location: University of Queensland
Purpose: Electrical and optical device testing including electrical probe station, AM1.5G solar cell testing, organic light emitting diode testing station and spectroscopy facilities
Material systems: Organics and organic/inorganic hybrids
Node: Queensland
Scale/volume: prototype devices up to 10 x 10 cm
Specifications/resolution: AM1.5G AAA illumination