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Atomic force microscope - tip enhanced raman scattering AFM

The Nanonics-Horiba AFM-Raman system is capable of providing simultaneous topographic and chemical information for a sample surface. The Horiba XploRA Raman spectrometer possesses three excitation laser wavelengths at 532, 638 and 785nm with optical density control, and AFM is able to be performed in liquid.

The system may operate independently as an AFM or confocal Raman instrument, however when integrated it is possible to perform AFM-Raman or tip-enhanced Raman spectroscopy (TERS) measurements. Greater than 50nm resolution may be obtained depending on the quality of the TERS probe, and areas up to 100x100 microns wide may be imaged. A variety of near-field scanning optical microscopy (NSOM/SNOM) configurations are also available.

Fabrication step: Characterisation
Function: Surface - thin films
Location: Flinders University
Purpose: Topographical imaging of substrates/microfluidic channels and nanoscale spectroscopy of chemical modifications
Material systems: Any
Node: South Australia
Scale/volume: Few nanometers to 100's of microns
Specifications/resolution: Imaging: sub nanometer scale, verically and 1-2 nanometers laterally and spectroscopy: TERS provides enhancement of signals so can detect nano or pico molar amounts