Capability directory

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Characterisation microscopy capabilities
JEOL JSM 840A Scanning electron microscopes SEM - Monash Universityview more details
Olympus Optical microscope with charge-coupled device camera - Monash Universityview more details
Philips CM20 Transmission Electron Microscope TEM - Monash Universityview more details
Atom Probe Tip Polisher - Monash Universityview more details
Philips EM420 Transmission Electron Microscope TEM - Monash Universityview more details
Computer room and various software packages - Monash Universityview more details
Reichert FCS Cryo microtome - Monash Universityview more details
Darkroom Facilities - Monash Universityview more details
Reichert Ultracut E microtome - Monash Universityview more details
Dynavac Evaporative Coater - Monash Universityview more details
Struers Accutom 50 Precision Saw - Monash Universityview more details
Struers Tenupol 2 3 5 Twin Jet Electro Polishers - Monash Universityview more details
FEI Quanta 3D Focused Ion Beam Scanning electron microscopes FIB SEM - Monash Universityview more details
Orsay Physics Focussed Ion Beam - Melbourne Universityview more details
Digital holographic microscope - Melbourne Centre for Nanofabricationview more details
Dual Beam Focused ion beam - Melbourne Centre for Nanofabricationview more details
Dual Polarisation Interferometry - Farfield - Melbourne Centre for Nanofabricationview more details
Field Emission Scanning Electron Microscope FE SEM - Melbourne Centre for Nanofabricationview more details
Fourier transform infrared spectroscopy Microscope FTIR - Melbourne Centre for Nanofabricationview more details
High speed high resolution camera system - Melbourne Centre for Nanofabricationview more details