Capability directory

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Characterisation microscopy capabilities
Scanning Probe Microscopy - Deakin Universityview more details
TEM - Deakin Universityview more details
FIB/SEM - Deakin Universityview more details
Magnetic Property Measurement System (MPMS) - CSIRO Lindfieldview more details
Physical Property Measurement System (PPMS) - CSIRO Lindfieldview more details
FIB/SEM - CSIRO Lindfieldview more details
SAXS-WAXS - CSIRO Claytonview more details
GADDS-micro-XRD - CSIRO Claytonview more details
X-ray Diffraction (XRD) - CSIRO Claytonview more details
Atomic Force Microscopy (AFM) - CSIRO Claytonview more details
X-ray Photoemission Spectroscopy (XPS) - CSIRO Claytonview more details
Mass spectrometry - CSIRO Claytonview more details
Nuclear Magnetic Resonance (NMI) - CSIRO Claytonview more details
Electron Energy Loss Spectroscopy (EELS) - CSIRO Claytonview more details
Energy Dispersive X-ray Spectroscopy (EDXS) - CSIRO Claytonview more details
Back-scattered Electron Imaging (BSI) - CSIRO Claytonview more details
Non-contact optical metrology - CSIRO Claytonview more details
Non-contact optical metrology - CSIRO Claytonview more details
Cryo-TEM - CSIRO Claytonview more details
Transmission electron microscopes (TEM) - CSIRO Claytonview more details