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Atomic force microscope

Atomic Force Microscopes (AFMs) generate 3D topographic "images" of a surface. The ultra-sharp probe (approximately 10 nm radius) is either in completely or intermittently in contact with the surface as the sample positioned is scanned. Scan sizes range from 25 x 25 μm down to a few nm.

This AFM has been used to image polymer nanoparticles, surfactant lamellae on graphite and mica, conductive polymers and films, spermatozoa and polymer films.

Fabrication step: Characterisation
Function: Surface - thin films
Location: University of Newcastle
Purpose: High resolution topography, electrical and mechanical characterisation of surfaces
Material systems: All
Node: Materials
Scale/volume: up to 25 x 25 mm sample size
Specifications/resolution: Capable of point-defect atomic resolution. Methods available: AFM, CAFM, STM and droplet cell