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High resolution x-ray diffractometers

X-ray diffraction is a non-destructive analytical technique which reveals information about the crystal structure, chemical composition and physical properties of materials and thin films by studying the scattered intensity of an X-ray beam interacting with a sample as a function of incident and scattered angle, polarization, and wavelength or energy.

Fabrication step: Characterisation
Function: Bulk microscopy
Location: Australian National University
Purpose: Determination of crystal structure and composition
Node: Australian Capital Territory
Scale/volume: up to 6 inch substrate
Specifications/resolution: Rocking curve, reciprocal space mapping, reflectivity, grazing incident XRD, strain/stress, texture, micro-diffraction, and powder analyses